F. Saffih, "Artificially Intelligent Method (AIM) for STEM-based electrical Engineering education and pedagogy case study: Microelectronics," 124th ASEE Annual Conference and Exposition , vol.2017-June, Ohio, United States Of America, 2017
Saffih, F. 2017. Artificially Intelligent Method (AIM) for STEM-based electrical Engineering education and pedagogy case study: Microelectronics. 124th ASEE Annual Conference and Exposition , (Ohio, United States Of America).
Saffih, F., (2017). Artificially Intelligent Method (AIM) for STEM-based electrical Engineering education and pedagogy case study: Microelectronics . 124th ASEE Annual Conference and Exposition, Ohio, United States Of America
Saffih, FAYCAL. "Artificially Intelligent Method (AIM) for STEM-based electrical Engineering education and pedagogy case study: Microelectronics," 124th ASEE Annual Conference and Exposition, Ohio, United States Of America, 2017
Saffih, FAYCAL. "Artificially Intelligent Method (AIM) for STEM-based electrical Engineering education and pedagogy case study: Microelectronics." 124th ASEE Annual Conference and Exposition , Ohio, United States Of America, 2017
Saffih, F. (2017) . "Artificially Intelligent Method (AIM) for STEM-based electrical Engineering education and pedagogy case study: Microelectronics." 124th ASEE Annual Conference and Exposition , Ohio, United States Of America.
@conferencepaper{conferencepaper, author={FAYCAL SAFFIH}, title={Artificially Intelligent Method (AIM) for STEM-based electrical Engineering education and pedagogy case study: Microelectronics}, congress name={124th ASEE Annual Conference and Exposition}, city={Ohio}, country={United States Of America}, year={2017}}