Use of hall effect semiconductors in geotechnical instrumentation

Clayton C. R., KHATRUSH S. A. S. M., Bica A. V., Siddique A.

Geotechnical Testing Journal, vol.12, no.1, pp.69-76, 1989 (Scopus)

• Publication Type: Article / Article
• Volume: 12 Issue: 1
• Publication Date: 1989
• Doi Number: 10.1520/gtj10676j
• Journal Name: Geotechnical Testing Journal
• Journal Indexes: Scopus
• Page Numbers: pp.69-76
• Istanbul Gelisim University Affiliated: Yes