Discussion on 'the use of hall effect semiconductors in geotechnical instrumentation'


Clayton C., KHATRUSH S. A. S. M., Bica A., Siddique A.

Geotechnical Testing Journal, vol.13, no.1, pp.63-67, 1990 (Scopus) identifier

  • Publication Type: Article / Article
  • Volume: 13 Issue: 1
  • Publication Date: 1990
  • Doi Number: 10.1520/gtj10149j
  • Journal Name: Geotechnical Testing Journal
  • Journal Indexes: Scopus
  • Page Numbers: pp.63-67
  • Istanbul Gelisim University Affiliated: Yes

Abstract

To accurately measure stiffness of soils at small strain levels has been one of the challenging topics in geotechnical engineering laboratories during the last decade. The necessity has been accelerated in conjunction with the rapid development of computer-based deformation analysis in geotechnical engineering. In the geotechnical engineering laboratory at the Institute of Industrial Science (IIS), University of Tokyo, a simple device named local displacement transducer (LDT), which was developed by Goto, has been under intensive use for measuring local axial displacements of triaxial and plane strain specimens subjected to shearing in compression. This paper discusses the nonlinear device for axial small strain determination in soils.